G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. G01Q 60/30 - Scanning potential microscopy G01N 24/08 - Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance H01J 49/26 - Mass spectrometers or separator tubes G01Q 10/04 - Fine scanning or positioning monopole, quadrupole, multipole, farvitrons H01J 49/42 - Stability-of-path spectrometers, e.g. arrangements for actively controlling the movement or position of the probe G01Q 10/00 - Scanning or positioning arrangements, i.e. G01Q 20/00 - Monitoring the movement or position of the probe X-rays or neutrons, not covered by groups, or by transmitting the radiation through the material and forming images of the material G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. G01N 3/42 - Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. G01Q 30/04 - Display or data processing devices blood, urine Testing involving biospecific ligand binding methods Immunological testing involving proteins, peptides or amino acids G01N 33/68 - Chemical analysis of biological material, e.g. G01Q 30/02 - Non-SPM analysing devices, e.g. G01B 5/28 - Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces sample cells, spinning mechanismsī08B 7/00 - Cleaning by methods not provided for in a single other subclass or a single group in this subclass G01R 33/30 - Sample handling arrangements, e.g.

G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. G01Q 60/24 - AFM or apparatus therefor, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions G01Q 20/02 - Monitoring the movement or position of the probe by optical means X-rays or neutrons, not covered by groups, or by using reflection of the radiation by the materials G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. G01Q 10/06 - Circuits or algorithms thereforī82Y 35/00 - Methods or apparatus for measurement or analysis of nanostructures G01V 3/00 - Electric or magnetic prospecting or detecting Measuring magnetic field characteristics of the earth, e.g.

Bruker epr iris motor